Synopsis

ID10 is a multi-purpose, high-brilliance undulator beamline for X-ray scattering with two independent stations, ID10-SURF and ID10-COH, the former is specialized in studies of soft interfaces and the latter is investigating structure and dynamics in disordered systems using coherent X-ray beams.

The end-station ID10-SURF is located in the upstream experimental hutch EH1 and is dedicated to high-resolution X-ray scattering and surface diffraction on liquid and solid interfaces, combining multiple techniques in a single instrument.

The end-station ID10-COH is located in the downstream hutch EH2 and exploits coherence in the far field. X-ray Photon Correlation Spectroscopy is used to quantify temporal fluctuations in disordered media in various scattering geometries at small and wide scattering angles. Coherent Diffraction Imaging is used to visualize microscopic specimens with nanometer resolution.

ID10-SURF and ID10-COH operate in 50% time sharing mode.

ID10-SURF in brief

  • Equipped with a double-crystal deflector coupled to a 6 + 2 diffractometer to perform high-resolution X-ray scattering at grazing incidence in various horizontal and vertical geometries: X-ray Reflectivity (with double-crystal deflector on liquid surface up to Qz = 2.4 Å-1), Grazing-Incidence Small & Wide-Angle Scattering, Grazing-Incidence Diffraction
  • Liquid-N2 cooled channel-cut monochromator with polished Si(111) and Si(311) crystals (shared) Energy tunability: 7 – 30 keV 
  • Horizontal flat double-mirror for high harmonics suppression (shared)
  • Focusing optics based on Be Compound Refractive Lenses for a variable beam size down to 35µm x 10µm (HxV, FWHM)

ID10-SURF Key Activities

Structural properties and self-organization processes at surfaces, interfaces and in thin films, both in-plane and normal to the film, at length scales from sub-nm to 500nm, e.g.:

  • Langmuir films, amphiphilic polymers and nano-particles at the air-water interface
  • Surface structure of complex fluids (colloid, gel, sol…)
  • Surface roughness and capillary waves
  • Structure and growth of two-dimensional materials of atoms, molecules, macromolecules and proteins
  • Morphology and crystalline structure of thin organic and non-organic films on solid substrates
  • Shape, strain, ordering and correlation of crystalline nanostructures in 0D (quantum dots) and 1D (wires) on substrates

ID10-COH in brief

  • Optimized for probing dynamics in disordered media in the time domain using coherent X-ray beams and X-ray Photon Correlation Spectroscopy in various scattering geometries                                            Time window: 10-8 – 103 s
  • Equipped with a four-circle diffractometer in horizontal geometry for Small & Wide Angles X-ray Scattering
  • Equipped with a horizontal goniometer for Tomographic Coherent X-ray Diffraction Imaging
  • Available range for detector distance: 2 – 7 m
  • Liquid-N2 cooled channel-cut monochromator with polished Si(111) and Si(311) crystals (shared) Energy tunability: 7 – 30 keV 
  • Horizontal flat double-mirror for high harmonics suppression (shared)
  • Focusing optics based on Be Compound Refractive Lenses for a variable beam size down to 5µm x 3µm (HxV, FWHM)
  • Average coherent flux up to ~ 1012 photons/s (focused beam)

ID10-COH Key Activities

X-ray Photon Correlation Spectroscopy (XPCS) is the X-ray analog of Dynamic Light Scattering but at X-ray length scales with (partially) coherent X-ray beams. XPCS quantifies temporal correlations in a fluctuating (far-field) speckle pattern due to the medium (slow) dynamics in-equilibrium and out-of-equilibrium on timescales beyond the reach of the inelastic (X-ray or neutron) techniques. XPCS typically covers a time window from 10-8 s to 103 s at length scales from several thousand angstroms (Q~10-3 Å-1) down to atomic resolution (Q~1 Å-1) depending on the scattering geometry, to study:

  • Dynamics in glass forming systems
  • Dynamics in structural glasses, at high temperature and high pressure in diamond anvil cells
  • Dynamics in colloidal and protein solutions
  • Domain-formation and dynamics in phase separating systems
  • Critical dynamics

Coherent X-ray Diffraction Imaging measures speckle patterns that reflect the electron density distribution of the object via Fourier transform. The real space image of the specimen is obtained by applying iterative phase retrieval to over-sampled speckle patterns. Tomographic reconstructions of up to 6 µm, isolated non-crystalline objects can be routinely obtained down to 10-15 nm resolution at 8 KeV, to study:

  • Bio-mineral hierarchical structures
  • Porous semiconductor materials
  • Mineral nano-crystals and nano-structures
  • Biological cells and materials

 

Complementary Information

Link to the individual pages

ID10-SURF
 
ID10-COH