Synopsis
ID01 is an X-ray diffraction and scattering beamline devoted to the study of a wide variety of materials, from nanostructures to bulk, with the ability to perform imaging of strain and structure using full field diffraction imaging, coherent X-ray diffraction methods and/or nanodiffraction.
Typical samples range from microelectronic devices to novel metal-organic solar cells or battery electrodes.
Status:
open
Disciplines
- Materials and Engineering
- Physics
- Chemistry
- Environmental Sciences
- Medicine
Applications
- Materials science
- Condensed matter physics
- Chemistry
Techniques
-
CDI - coherent diffraction imaging
-
GISAXS - grazing incidence small-angle scattering
-
Microbeam
-
Ptychography
-
XRD - X-ray diffraction
Beam size
- Minimum (H x V) : 35.0
x 35.0
nm²
-
Maximum (H x V) : 6.0
x 1.0
mm²
Sample environments
- Nanotranslations stages
- Furnace (T < 1000°C)
- He miniflow cryostat (T > 2.5K)
Detectors
- 0D: APD
- 0D: Amptek
- 2D: Maxipix pixel detector (516x516) 55 micron pixels
- 2D: Andor Zyla fiber optics CCD (2561x2160) 6.5 micron pixels
- 2D: Eiger 2M (1030x2164) 75 micron pixels
Technical details
Photon Flux
Nanofocused beam: 3x109 - 1x1011 (1-5x109 coherent) ph/s
FFDXM: 1x1012 ph/s
Other
For XRD, the beamline offers nanodiffraction (Fresnel zone plates/ KB mirrors), microdiffraction (beryllium lenses), and coherent X-ray diffraction. A high-precision Huber diffractometer is available. The sample stage is installed on a granite table for stability and is decoupled from the detector arm. A compact hexapod is on top of the sample stage for fine alignment of the sample. Piezo stages with capacitive encoders for high precision nanotranslations are on top of the hexapod. 0D, 1D and 2D detectors are available. Typical vibration levels on the beamline have been measured at 20-30nm, drifts from 60-100nm/hr after the experiment hutch has been closed for 12-24 hours. Several in-situ chambers are available; including cooling, heating, gas flow and vacuum.
References
SXDM (quicK-MAPping)
[1] Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping, G. A. Chahine et al., J. Appl. Cryst. (2014)
FFDM
[2] Full-field X-ray diffraction microscopy using polymeric compound refractive lenses, J. Hilhorst, F. Marschall, T. N. Tran Thi, A. Last and T. U. Schülli, J. Appl. Cryst. (2014)
BCDI
[3] Inversion domain boundaries in GaN wires revealed by coherent bragg imaging, S. Labat et al. ACS Nano (2015)
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The interplay between strain, Sn content, and temperature on spatially dependent bandgap in Ge1−xSnx microdisks
Zaitsev I., Corley-Wiciak A.A., Corley-Wiciak C., Zoellner M.H., Richter C., Zatterin E., Virgilio M., Martín-García B., Spirito D., Manganelli C.L.,
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Imaging the strain evolution of a platinum nanoparticle under electrochemical control
Atlan C., Chatelier C., Martens I., Dupraz M., Viola A., Li N., Gao L., Leake S.J., Schülli T.U., Eymery J., Maillard F., Richard M.I.,
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Direct observation of large-area strain propagation on free-standing nanomembranes
Bernardes Y., Marçal L.A.B., Rosa B.L.T., García Jr A., Deneke C., Schülli T.U., Richard M.I., Malachias A.,
Physical Review Materials 7, 026002-1-026002-7 (2023)
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