The AFM tip can also be used to deform materials and study its mechanical behaviour in-situ. (Nano-Indenter)

Xray-technique : simultaneous measurements of topography (AFM) and crystallinity (XRD)

EdittingAFM.jpg

Scanning force microscope for in situ nanofocused X-ray diffraction studies

Inhouse-user-colaboration

ID01 - MICRODIFFRACTION IMAGING