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- Sample Environment Support Service
- Sample environments available on our Beamlines
- Sample Environments on ID01
- AFM, indenters, strain rigs etc, currently developed by users
AFM, indenters, strain rigs etc, currently developed by users
AFM, indenters, strain rigs etc, currently developed by users collab
The AFM tip can also be used to deform materials and study its mechanical behaviour in-situ. (Nano-Indenter)
Xray-technique : simultaneous measurements of topography (AFM) and crystallinity (XRD)
Scanning force microscope for in situ nanofocused X-ray diffraction studies
Inhouse-user-colaboration