Lowest Temp: 5K Highest Temp: 50 K. Only fixed temperature measurements. Sample stability better than 100 nm during more than 24 hours at low Temp.

Optimised for Si3N4 windows. Maximum Frame dimensions: 5x5 mm

Xray-techniques: X-ray fluorescence, XRD (transmission), XEOL 

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He-Cryostat

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Sample Holder for He-Cryostat

Inhouse development (SE lab, R. Steinmann)

ID16B - NANO-ANALYSIS BEAMLINE