X-ray Bragg diffraction imaging (“topography”) at the ESRF: a unique tool to visualise and characterise defects in crystals

Industry Webinar
Start Date
14-12-2021 11:00
End Date
14-12-2021 12:00
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Scientific contact(s)
Ed Mitchell
Ennio Tito Capria

Tuesday, December 14th at 11:00

Industry@ESRF-EBS webinar
X-ray Bragg diffraction imaging (“topography”) at the ESRF: a unique tool to visualise and characterise defects in crystals

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Topography industrial liaison scientist Thu Nhi is our expert in different X-ray Imaging techniques such as X-ray topography, Rocking Curve Imaging and section topography, which are well adapted to provide quantitative and qualitative information on defects in single crystals.

Emeritus Scientist Former scientist in charge of beamline ID19 and Former Head of Imaging Group.

X-ray Bragg diffraction imaging (historically called “X-ray topography”) is a unique characterisation tool for assessing and visualising crystal quality and defects across a wide range of technologically important crystalline materials. Crystal defects can be very detrimental for the performance of the devices produced from the crystals. Application areas therefore include semiconductor materials (e.g. Si, Ge, SiC, GaN) and crystals for optical applications (e.g. quartz, sapphire, KTP, KTA and LBO). The ESRF operates a world-unique synchrotron X-ray topography instrument which is used by clients from the semiconductor, power electronics, opto-electronics and MEMs industries. An important feature of X-ray Bragg diffraction imaging is that it analyses large (~cm2) fields of view with high-spatial resolution and high-sensitivity imaging of defects such as dislocations, inclusions, growth sectors and growth striations. “Rocking curve imaging”, as an advanced implementation of X-ray topography, allows a finer description of the strain environment around a defect, enabling a better understanding of the material properties.
From this webinar you will learn the physical basis of the imaging technique, the advantages of synchrotron-based topography and the information it provides on crystalline materials illustrated with different types of results from real materials