ID16A - Nano-imaging Beamline

Synopsis

The beamline provides a high-brilliance beam focused down to nanometer size, allowing quantitative 3D characterization of the morphology and the elemental composition of specimens in their native state by combining coherent imaging techniques and X-ray fluorescence microscopy.

Status: open

Disciplines

Materials and Engineering
Medicine
Environmental Sciences
Earth and Planetary Sciences
Physics
Life Sciences

Applications

Advanced materials
Biomedicine
Environmental sciences
Energy
Nanotechnology
Neuroscience

Techniques

Coherent imaging
Holography
Imaging, phase-contrast
Ptychography
Scanning transmission X-ray microscopy
Tomography
XRF - X-ray fluorescence

Energy range

17.0 - 33.6 keV

Beam size

Minimum (H x V) : 30.0 x 30.0 nm²
Maximum (H x V) : 400.0 x 400.0 µm²

Sample environments

Room-temperature, in vacuum
Cryo-environment, in vacuum

Detectors

Fluorescence 1: two seven elements silicon drift diode detectors (Vortex-ME7, 7-element Hitachi)
Fluorescence 2: 16-element silicon drift diode detector (based on Falcon-electronics, 16-element Ardesia)
Fluorescence 1 & 2: by default used in parallel, data are combined during post-processing.
Imaging default: lens-coupled CMOS-camera (ESRF-customized based on a Ximea-camera, 6144x6144 pixels, 10 um physical pixel size with 10x-objective and 3x3-binning -> 3 um physical pixel size in raw data; scintillator: 20 um LSO)
Imaging optional 1: imaging detector lens-coupled to a FReLoN F_K4320 (2048x2048 pixels, 1.1 um pixel size)
Imaging optional 2: imaging detector lens-coupled to a FReLoN F_E230-84 (4096x4096 pixels, 1.5 um pixel size) and to a SVCam-HR16070 (4864x3232 pixels, 1.5 um pixel size)