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ID16A - Nano-imaging Beamline

Synopsis

The beamline provides a high-brilliance beam focused down to nanometer size, allowing quantitative 3D characterization of the morphology and the elemental composition of specimens in their native state by combining coherent imaging techniques and X-ray fluorescence microscopy.
Status:  open

Disciplines

  • Materials and Engineering
  • Medicine
  • Environmental Sciences
  • Earth and Planetary Sciences
  • Physics
  • Life Sciences

Applications

  • Advanced materials
  • Biomedicine
  • Environmental sciences
  • Energy
  • Nanotechnology
  • Neuroscience

Techniques

  • Coherent imaging
  • Holography
  • Imaging, phase-contrast
  • Ptychography
  • Scanning transmission X-ray microscopy
  • Tomography
  • XRF - X-ray fluorescence

Energy range

  • 17.0 - 33.6  keV

Beam size

  • Minimum (H x V) : 30.0 x 30.0  nm²
  • Maximum (H x V) : 400.0 x 400.0  µm²

Sample environments

  • Room-temperature, in vacuum
  • Cryo-environment, in vacuum

Detectors

  • Fluorescence 1: two seven elements silicon drift diode detectors (Vortex-ME7, 7-element Hitachi)
  • Fluorescence 2: 16-element silicon drift diode detector (based on Falcon-electronics, 16-element Ardesia)
  • Fluorescence 1 & 2: by default used in parallel, data are combined during post-processing.
  • Imaging default: lens-coupled CMOS-camera (ESRF-customized based on a Ximea-camera, 6144x6144 pixels, 10 um physical pixel size with 10x-objective and 3x3-binning -> 3 um physical pixel size in raw data; scintillator: 20 um LSO)
  • Imaging optional 1: imaging detector lens-coupled to a FReLoN F_K4320 (2048x2048 pixels, 1.1 um pixel size)
  • Imaging optional 2: imaging detector lens-coupled to a FReLoN F_E230-84 (4096x4096 pixels, 1.5 um pixel size) and to a SVCam-HR16070 (4864x3232 pixels, 1.5 um pixel size)