Thulium Datas in eV |
EK |
ΔEK |
EL1 |
ΔEL1 |
EL2 |
ΔEL2 |
EL3 |
ΔEL3 |
ELα1 |
ELα2 |
ELß1 |
ΔELα1 |
ΔELα2 |
59390 |
30.1 |
10116 |
5.47 |
9617 |
4.79 |
8648 |
4.48 |
7179.9 |
7133.1 |
8101 |
5.28 |
5.97 |
Main beamline parameters at L3 -edge |
Bending Magnet |
Monochromator |
Mirrors |
Vertical div. (mrad) |
Cristal type |
Angle (°) |
Resolution (eV) |
Angle (mrad) |
Cut-off energy (keV) |
0.191 |
Si(220) |
21.95 |
0.443 |
4.5 |
13.0 |
Si(111) |
13.23 |
1.18 |
Experiments already done with this element / available references
Andreev T., Y. Hori, X. Biquard, E. Monroy, D. Jalabert, A. Farchi , M. Tanaka, O. Oda, L Si Dang, B. Daudin, “Optical and morphological properties of GaN quantum dots doped with Tm”, Physical Review B 71 (2005) 115310