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ESRF Highlights
ESRF Highlights 2001
Applied and Industrial Research

Applied and Industrial Research

ESRF Highlights 2001
Applied and Industrial Research

Introduction
First Direct 3D Visualisation of Microstructural Changes During Sintering
Industrial Microtomography Applications at ID19
Structural Defects in SiC Schottky Diodes
The "Lifetime" of Defects in Silicon after Ion-Implantation and Annealing
How Synchrotron Light can Help Develop Faster Computers
Structural Transformations and Physical Properties of Zopiclone

Contents

Introduction
Structural Transformations and Physical Properties of Zopiclone
First Direct 3D Visualisation of Microstructural Changes During Sintering
Industrial Microtomography Applications at ID19
Structural Defects in SiC Schottky Diodes
The "Lifetime" of Defects in Silicon after Ion-Implantation and Annealing
How Synchrotron Light can Help Develop Faster Computers

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