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4 5 I H I G H L I G H T S 2 0 2 3
X-ray diffraction, essential in relating the atomic structure of solids to their functions and physical properties, and spectroscopy, revealing the energetics of electrons in matter, are the most popular applied techniques. Many of the highlighted articles in this chapter demonstrate the use of X-ray diffraction in various different forms, including in-situ, time-resolved, powder, total scattering, grazing incident, Bragg coherent imaging, dark-field X-ray microscopy, etc. Another commonly used X-ray technique among the selected articles is inelastic X-ray scattering, revealing lattice and spin dynamics and electronic structure. Resonant inelastic X-ray scattering is also exploited to study the electronic, magnetic and structural properties of quantum materials and molecules. All these techniques are increasingly used to observe materials at work, helping researchers to use new and existing materials efficiently or even to modify them to imbue them with novel properties. Since many of these techniques are photon-hungry, extremely brilliant X-ray sources, like ESRF-EBS, are crucial.
The above-mentioned techniques are often combined with others to give deeper insight into the structure and function of materials, with the result that many experts from different fields are now working together on the same challenges. As Als-Nielsen and Materlik said in Physics Today [1], The synchrotron radiation facility is changing not just the tools of condensed matter physics, but also its sociology. At synchrotron radiation facilities, many comparatively small groups of physicists, chemists, biologists and other researchers [are] constantly interacting, creating a stimulating atmosphere conducive to the cross fertilization of ideas and techniques.
Last but not least, as many of the articles in this chapter demonstrate, fundamental science is necessary to pave the way towards the development of innovative materials and technologies for tomorrow s sustainable industry.
V. HONKIMÄKI
REFERENCES
[1] J. Als-Nielsen, G. Materlik, Phys. Today 48 (11), 34-40 (1995).