Vacuum Process Gas Analysis for Deposition Systems Vacuum Diagnostics Realtime Precursor Analysis Leak Checking Residual Gas Analysis
Analysis of Reaction Kinetics Plasma Deposition Processes Mass Resolved Ion Energy Analysis Neutrals and Radical Analysis Positive and Negative Ion Analysis
Nanoscale Film Analytics 3D Depth Profi ling Nanometre Depth Resolution Composition Contamination Diff usion and Interface Analysis
Instruments for Advanced Science Mass spectrometers for vacuum, gas, plasma and surface science
www.HidenAnalytical.comW E info@hiden.co.uk
www.hidenanalytical.com info@hiden.co.uk
EQP Series
SIMS Series
HPR-30 Series
30546 IOP - 213x282 - ADVANCED SCIENCE.indd 1 06/04/2022 12:06
