The D2AM beamline is considered as a highly efficient tool for advanced, in situ synchrotron characterization in materials science, e.g., single crystal or polycrystalline materials, powders, liquids, thin films, or epitaxial nanostructures. Despite its design and the equipment available, the sample environments are a major element in the beamline reputation in situ characterization. A number of these sample environments were designed for specific technique frequently used at the beamline. In addition, the beamline benefits from the ESRF instrument pool support to expend its repertoire and offer the possibility for users to bring their own sample environment that can be installed on the beamline diffractometer to widen even further its potential and flexibility for in situ scattering measurements.