The diffractometer is a general purpose diffractometer in z-axis geometry for surface diffraction with samples having the surface in a horizontal plane. The samples may be in air on inside small experimental set ups. The topmost plate of the last diffractometer component is at a distance of 170 mm from the center of the diffractometer where the sample has to be located. A similar distance separates the center of the instrument from the post sample slits in the detector arm. High resolution measurements are feasible since the resolution of the theta arm is 0.2 mdeg. Also, the detector arm is equipped with three rotations to orient an analyzer crystal.

Experimental hutch #2

A z-axis diffractometer with the main axis horizontal allows to orient the sample ( surface in vertical plane ) that sits in a UHV chamber. There are facilities for sample annealing (~1200 K maximum ) and cooling (120 K or 60 K depending if liquid nitrogen or liquid helium are used). Other facilities are ion sputtering, Auger Spectroscopy, RHEED (not too used) and two or three evaporation cells for depositions. Typical experiments are surface structural studies of clean surfaces or interfaces, homoepitaxial growth experiments, phase transitions.... The UHV system above is heavily used with a variety of samples and of evaporation cells. The base pressure after a 24h bakeout is 1-2 10 -10 mbar. Ultra-clean experiments requiring 10 -11 mbar pressures are not recomended for the above reason.