ID24-DCM

Synopsis

ID24-DCM (Double Crystal Monochromator) is a versatile energy scanning EXAFS beamline with an undulator source. It covers a large energy range (5-45 keV), with high flux on the sample (up to 8 10^13 photons/s) that can be varied and a very high brilliance (up to 3 10^13 photons/s/microns). The a millimeter size X-ray beam (1*1 mm) can be used or it can be focused down to 0.6x0.6 microns FWHM. The time resolution is down to 1s/EXAFS for a single scan and 2s/EXAFS for consecutive scans. The beamline is very versatile and can operate in different modes (from fully focused to unfocused) depending on scientific case, sample heterogeneity and sample radiation hardness. It specifically targets XAS experiments that require time-resolution, extreme conditions and microscopy combined with XES and XRD.

Status: open

Disciplines

Physics
Earth and Planetary Sciences
Chemistry
Materials and Engineering

Applications

Solid state physics
Geosciences
Planetary Science
Catalysis
Materials science
Environmental science

Techniques

XANES - X-ray absorption near-edge structure
EXAFS - extended X-ray absorption fine structure
Microbeam
XRF - X-ray fluorescence
XES - X-ray emission spectroscopy
RIXS - resonant inelastic X-ray scattering
XRD - X-ray diffraction

Energy range

5.0 - 45.0 keV

Beam size

Minimum (H x V) : 0.6 x 0.6 µm²
Maximum (H x V) : 1000.0 x 1000.0 µm²

Sample environments

CHEMISTRY
in situ operando XAS/DRIFTS/MS and XAS/XRD/MS
gas exchanger system for chemistry
high-pressure chemistry setup (10 bars, 800 K)
MICRO-XAS/XES
5 crystal analyzer (5-22 keV down to 0.5 eV energy resolution)
optical microscope (micron resolution)
dynaflow cryostat for 5 mm pellets or 1-inch samples (2K)
EXTREME CONDITIONS MICRO-XAS/XRF/XES/XRD
Diamond anvil cell (DAC) (up to multi-Mbar pressures 400 GPa)
Laser-heated DAC (5000 K, 150 GPa)
Resistive heated DAC (1500 K, 100 GPa)
High-pressure cryostat (5 K, 100 GPa)
Paris Edinburgh Press

Detectors

TRANSMISSION XAS
HV Ionization chambers
Photodiodes and Avalanche Photodiodes (APD)
Multi element Silicon Drift diodes
XRF MEASURMENTS
Single element Si SDD XRF detector ( 1mm or 2 mm sensor thickness Parker, Keteck)
Multi element Si SDD XRF detector (7 element, Vortex-ME7, seven 1 mm thick individual sensors )
Multi element Si SDD XRF detector (16 element, Ardesia, 1 mm thick monolithic sensor segmented and collimated in 16 individual detectors)
Single element Ge SDD XRF detector (1mm sensor thickness, shared with ID15a)
XES / RIXS
crystals analyzer (5 crystals, 0.5 m radius of Roland circle)
vonHamos detector (with the laser heated DAC - under commissioning available 2026)
XRD
Pilatus 2M detector