Second International Workshop on Metrology for X-ray Optics

Dates: 1st - 2nd April 2004 Venue: ESRF, Grenoble, France Auditorium Local organising committee: Olivier Hignette, Amparo Rommeveaux, Christian Morawe, Eva Jahn

Scope of the workshop

The first meeting on Metrology for X-Ray optics was held at APS in March 2000.
In this second meeting we would like to share the experience of the metrology community specialised in synchrotron radiation X-ray optics.
Manufacturers of optics components and metrology equipment as well as synchrotron specialists should participate in this meeting. This workshop should be very informal, with emphasis on actual laboratory procedures and detailed technological developments and focus on the limits and achievements of our instruments with respect to the needs of our end users.

Announcement

Participation in this workshop is on invitation only. The invitations are sent individually to all pre-selected participants who are however welcome to invite colleagues, that they feel should participate in the workshop.

Please note that registration to the workshop is closed now.

Looking forward to meeting you in Grenoble.

The organising committee.