Invited Speakers
Alberta Bonanni, Johannes Kepler University, Linz-Austria
Insight into functional modulated structures based on transition metal doped nitrides
through synchrotron-based characterization
Johann Coraux, CNRS Grenoble-France
Strain and Defects in Epitaxial Graphene on a Metal Investigated by Diffraction Experiments
Paul Evans, University of Wisconsin-Madison, USA
Interface structure and ultrafast domain dynamics in epitaxial ferroelectric superlattices
Paul Fuoss, APS, USA
In Situ X-ray Studies of the Synthesis of Wide Bandgap Semiconductors
Patrice Gergaud, CEA LETI, Grenoble-France
Strain field determination in micro and nanotechnologies using sub-micronic X-ray beams
Tamzin Lafford, ESRF, Grenoble-France
Shedding light on silicon solar cells
Mojmir Meduna, Masaryk University, Brno-Czech republic
Perfect crystals grown on highly mismatched interfaces investigated by submicron diffraction
Panos Poulopoulos, University of Patras, Greece
Recent progress in EuS-based multilayers for room temperature spintronics
Thomas Schroeder, IHP Frankfurt/Oder-Germany
Getting electronic materials ready for technology by Synchrotron research: In-operando and in-line characterization needs
Marco Salluzzo, CNR, Naples-Italy
Orbital reconstruction and interface magnetism in SrTiO3 based heterostructures
Margriet J. Van Bael, KU Leuven, Belgium
Probing nano- and interface magnetism in hybrid systems by nuclear resonant scattering