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ptychography. These developments will be key to making this a microscopy technique that can be used by non- specialists across a wide range of instruments [3]. These exciting prospects are fuelling efforts to study how atomic-scale crystal defects influence the behaviour of all sorts of materials that underpin technologies central to modern life.

Fig. 72: a) 2D strain maps make it possible to localise specific features, described hereafter. b) 2D cross section along the sample thickness direction, showing strain from sample preparation-induced defects at the top and bottom surfaces. c) 1D plot of the strain profile close to, and further away from, the grain boundary. In the implanted region, the strain decreases near the grain boundary. d) 1D plot of the strain extracted across the grain boundary, showing the presence of a partially denuded (i.e., strain-reduced) region, as further evidenced by comparison with the simulations.

PRINCIPAL PUBLICATION AND AUTHORS

Revealing nano-scale lattice distortions in implanted material with 3D Bragg ptychography, P. Li (a,b), N.W. Phillips (c,d), S. Leake (e), M. Allain (a), F. Hofmann (c), V. Chamard (a), Nat. Commun. 12, 7059 (2021); https:/doi.org/10.1038/s41467-021-27224-5 (a) Aix-Marseille Univ, CNRS, Centrale Marseille, Institut Fresnel, Marseille (France). (b) Diamond Light Source, Harwell Science and Innovation Campus, Didcot (UK). (c) Department of Engineering Science, University of Oxford, Oxford (UK). (d) Paul Scherrer Institut, Villigen (Switzerland). (e) ESRF

REFERENCES [1] D.R. Mason et al., Phys. Rev. Letts. 125, 225503 (2020). [2] F. Mastropietro et al., Nat. Mater. 16, 946 (2017). [3] P. Li et al., Light Sci. Appl. (2022).