Correlation of Optical, Structural, and Compositional Properties with V-Pit Distribution in InGaN/GaN Multiquantum Wells

M. Zoellner et al., ACS Applied Material Interfaces (2019)

Advanced Coherent X-ray Diffraction and Electron Microscopy of Individual InP Nanocrystals on Si Nanotips for III-V-on-Si Electronics and Optoelectronics

G. Niu et al., Phys. Rev. Applied (2019)

The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure 

S. J. Leake et al., J. Synchrotron Rad. (2019)

Three-dimensional imaging of phase ordering in an Fe-Al alloy with Bragg Ptychography

C. Kim et al., PRL (2018)

Domain wall orientations in ferroelectric superlattices probed with synchrotron X-ray diffraction

M. Hadjimichael et al., PRL (2018)

Crystallographic orientation of facets and planar defects in functional nanostructures eluciated by nano-focused coherent diffractive X-ray imaging

M. I. Richard et al., Nanoscale (2018)

X-ray nanobeam diffraction imaging of materials

T. U. Schulli and S. J. Leake, Current Opinion in Solid State and Materials Science (2018)

Hard x-ray multi-projection imaging for singles-shot approaches

P. Villanueva-Perez et al., Optica (2018)

Threefold rotation symmetry in hexagonally shaped core-shell (In,Ga)As/GaAs nanowires revealed by coherent x-ray diffraction imaging.

A. Davtyan et al., J. Applied Cryst. (2019)

Characterisation of individual stacking faults in a wurtzite GaAs nanowire by nanobeam x-ray diffraction

A. Davtyan et al., J. Synch. Rad. (2019)

Coherent nanoscale X-ray probe for crystal interrogation at ID01, ESRF –
The European Synchrotron

 S. J. Leake et al. , Materials and Design  (2017).

Scanning X-ray nanodiffraction from ferroelectric domains in strained K0.75Na0.25NbO3 epitaxial films grown on (110) TbScO3

M. Schmidbauer et al., J. Applied Cryst. (2017)

Direct Evidence of Chlorine Induced Preferential Crystalline
Orientation in Methylammonium Lead Iodide Perovskites Grown on TiO

M. Bouchard et al., J. Phys. Chem. C, (2017)

Microstrain distribution mapping on CuInSe2 thin films by means of
electron backscatter diffraction, X-raydiffraction, and Raman

N. Schäfer et al. Ultramicroscopy169, 89 (2016).

Microstrain distributions in polycrystalline thin
films measured by X-ray microdiffraction

N. Schäfer et al., J. Appl. Cryst. (2016).

Miniaturized beamsplitters realized by X-ray waveguides

S. Hoffmann-Urlaub et al., Acta Cryst. (2016)

Correlation of electrical and structural properties of single as-grown GaAs nanowires on Si (111) substrates

G. Bussone et al., Nano Letters (2015)

Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging

S. Labat et al., ACS Nano  (2015)

Changes of the molecular structure in organic thin film transistors during operation

F. Liscio et al., Journal of Physical Chemistry C  (2015)

Structural mapping of functional Ge layers grown on graded SiGe buffers for sub-10 nm CMOS applications using advanced X-ray nanodiffraction

M. I. Richard et al., ACS Applied Materials & Interfaces  (2015)

X-ray optics on a chip: Guiding X rays in curved channels

T. Salditt et al., PRL (2015)

 Czochralski and mono-like p-type and n-type silicon solar cells: Relationship between strain and stress induced by the back contact, and photovoltaic performance

T. N. Tran Thi et al., Solar Energy Materials and Solar Cells (2015)

Imaging structure and composition homogeneity of 300 mm SiGe virtual substrates for advanced CMOS applications by scanning X-ray diffraction microscopy

M. H. Zoellner et al., ACS Applied Materials & Interfaces (2015)