Figure 109

Fig. 109: Same zone on the surface of a pre-fatigued Al-Si sample observed with three different techniques: a) optical micrograph, b) grain orientation mapping (EBSD): different colours correspond to different crystalline orientations, c) tomographic reconstruction after infiltration of Ga: cracks, Si particles and grain boundaries (enhanced absorption due to Ga) are easily distinguished. Note that a) & b) are restricted to the sample surface whereas the tomographic dataset contains information throughout the whole volume.