- Home
- Events
- Conferences and Workshops
- 2010
- Users' Meeting 2010 & Associated Workshops
- Nanobeam Workshop
Nanobeam Workshop
Science with X-ray Nano-beams
Science with X-ray Nano-beams |
|
Meeting Schedule: | 9 February 2010: all day 10 February 2010: poster session from 18.30 to 19.50 11 February 2010: afternoon 12 February 2010: morning |
Venue: | ILL Chadwick Amphitheatre (limited to 100 participants) |
Organizers: | Manfred Burghammer Dina Carbone Peter Cloetens Till Hartmut Metzger Tobias Schulli Gavin Vaughan |
Administrative Assistant: | Isabelle Combe |
Scope of the Workshop
During the past few years, the implementation of highly focused X-ray beams ranging from a few tens to a few hundreds of nanometers has become more and more eminent at third generation synchrotron sources. It has been demonstrated that these beams can be employed for high spatial resolution techniques such as X-ray fluorescence analysis, diffraction, scattering, and imaging. There are already a few beamlines at the ESRF and other facilities where the application of nano-beams to material science, soft matter research, and biology has entered routine operation. Future nano-beam projects play also an important role within the context of the ESRF Upgrade Program. The aim of this workshop is to take a snapshot of the state of the art in X-ray nano-beam research, to offer an opportunity for a vivid exchange amongst the scientists interested in this exciting rapidly evolving field, to discuss future challenges, and to identify new application areas.
The scientific program will cover the following topics related to X-ray nano-beam research:
- Soft Condensed Matter research and Biology
- Material Science Applications
- X-ray fluorescence analysis (XRF)
- High Resolution diffraction
- Imaging techniques, coherent X-ray Diffraction Imaging (CXDI)
- Scanning diffraction/scattering
- 3-D techniques like tomography based on XRF, diffraction, coherent imaging
- Instrumentation: focusing optics, diagnostics, nano-positioning
- Sample environments and complementary methods