The ID10 EH1 beamline is a multi-purpose, high-brilliance undulator beamline for high resolution X-ray scattering (XD) and surface diffraction on liquid and solid interfaces, combining grazing-incidence diffraction (GID), X-ray reflectivity (XRR), and grazing-incidence small-angle scattering (GISAXS) techniques in a single instrument. It is one of the two end stations of ID10 beamline working in the time sharing mode. Scattering experiments can be performed in both horizontal and in vertical scattering geometry. High-resolution studies are possible in both scattering geometries via the use of crystal analyzer stages in different orientations. Scientific applications cover studies of the structural properties of soft and hard condensed matter materials.

The main features of the beamline are:

EH1-SI:

  • high-resolution scattering instrumentation for horizontal and vertical scattering geometry
  • X-ray beam deflector for scattering from liquids (Qz < 2.4 Å-1)
  • energy-tunability: 7 keV < E < 24 keV with Si(111) and 14 keV < E < 30 keV with Si(311)
  • Silicon (111) or (311) crystal channel cut monochromator (intrinsic energy resolution ΔE/E: 1.4*10 -4 and 2.7*10 -5, respectively)
  • double-mirror setup for a strong suppression of higher harmonics.

Scientific Applications

With the techniques of GID, XRR and GISAXS, length scales from sub-nm to 100 nm, in some cases even up to 1000 nm, can be explored. This allows to investigate the structure and self-organization processes at surfaces, interfaces and in thin films both in-plane and normal to the film. Among the applications are studies of:

  • Langmuir films, amphiphilic polymers and nano- particle at the air-water interface
  • Surface structure of complex fluids (colloid, gel, sol,…)
  • Capillary wave and surface roughness
  • Structure and growth of two dimensional crystals of molecules, macromolecules and proteins
  • Morphology and crystalline structure of thin organic and non-organic films on solid substrates
  • Shape, strain, ordering and correlation of crystalline nanostructures, quantum dots and wires on substrates

Techniques Available

High-resolution Wide-angle Scattering (WAXS)

A versatile 8-circle diffractometer (2 (detector) + 3 (sample V-stage)+3 (sample H-stage)) at EH1 with a variable resolution set-up on the detector side (slits and crystal analysers) together with the available energy tunability permits virtually every diffraction experiment in horizontal or vertical scattering geometry.

Surface Scattering Techniques

  1. Grazing Incidence Small-Angle X-ray Scattering (GISAXS)
  2. Grazing Incidence Diffraction (GID)
  3. X-ray Reflectivity (XRR)

The EH1 instrumentation is compatible with GISAXS ,GID and XRR geometries in horizontal or vertical scattering geometry. The setup is optimized for experiments on liquid and fluid surfaces which are a particular specialty of the EH1 end station. A temperature and atmosphere controlled Langmuir trough integrated with active an antivibrational system is available at the beamline. Scattering profiles can be taken with either a 0-D detector or a 1-D detector.

Complementary Information