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Technical specifications
operational Sept. 1994 |
scientific applications |
XAS, Surface XAS |
source characteristics |
bending magnet ec = 19.2 keV |
source size 0.187 x 0.128 mm2 (HxV) FWHM | |
source divergence 115 x 5 µrad2 (HxV) FWHM | |
divergence for photon source(ec) dF =3.6 mrad, sR=50 µrad | |
peak brightness 7·1013 ph s-1mrad-2 (0.1% bw, 0.1A) | |
power (from 3.6 mrad of the source) 225 W FWHM | |
power density at 25 m 0.83 Wmm-2 FWHM | |
beam size at 25m 90 x 3 mm2 (HxV) FWHM | |
total horiz. ang. acceptance 3.6 mrad |
optics |
optical elements: mirror 1* double-crystal mono. mirror 2* |
distance from source: 25 m 28.5 m 32 m | |
focusing type: vert. coll. horiz. foc. vert. foc. | |
*mirrors only used for low energy set-up (5-28 keV) | |
beam size at sample: 1 x 2 mm2 (HxV) for 5 - 28 keV | |
1 x 2 mm2 (HxV) for 28 - 50 keV | |
spectral range: 5 - 85 keV | |
energy resolution DE/E: 10-5 - 10-4 | |
flux at sample: 1010 - 1011 ph s-1 (0.01%bw, 0.1A) |
detectors |
see text |