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InN thin film lattice dynamics revealed by grazing incidence inelastic x-ray scattering

01-06-2011

A combination of grazing incidence scattering and IXS from phonons, was used to measure the spectrum of lattice vibrations in a 6-micron-thick sample of indium nitride.

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Reference
InN Thin film lattice dynamics by grazing incidence inelastic X-ray scattering,
J. Serrano, A. Bosak, M. Krisch, F. J. Manjón, A. H. Romero, N. Garro, X. Wang, A. Yoshikawa, and M. Kuball, Phys. Rev. Lett. 106, 205501 (2011).

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European Synchrotron Radiation Facility - 71, avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France.