ABSTRACTS OF LECTURES

Jean-Marie DREZET - EPFL Lausanne

 Residual stresses in as-cast aluminium components: Neutron Diffraction measurements and FE modelling

Jeff PENFOLD - ISIS facility, STFC / PTCL, Oxford

Applied aspects of surfactant adsorption and self-assembly studied by NR, XR, SANS and SAXS

Claus M. SCHNEIDER - FZ Jülich

Addressing Problems in Microelectronics with Spectromicroscopy

Elin SONDERGARD - (CNRS - SAINT GOBAIN)

 

Characterisation of functional coatings using large scale facilities