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- Full Field Diffraction X-ray Microscope - Experimental Hutch
Full Field Diffraction X-ray Microscope - Experimental Hutch
Full field diffraction microscopy
Alternatively to nano focused beams, the ID01 primary optics is designed to condense a high flux beam on the sample and image the diffracted intensity by a downstream optics on a camera. This represents the full field equivalent of the scanning technique and requires long detector distances to obtain a geometric magnification compatible with high detection efficiency (pixel size) and sufficient working distance between sample and optics. The horizontal detector has a translation of the detector along the arm over a range of 4m that can work as a zoom function of the microscope. The sample stage for this microscope can be on the nano diffractometer as for nanodiffraction. In this case the optics is carried on the detector arm and projects the image into the long horizontal detector arm.