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  • Microfocussing and Imaging

Microfocussing and Imaging

  • ESRF Highlights 2000
  • Microfocussing and Imaging
    • Introduction
    • Use of Bragg Diffraction Imaging, with a Coherent Beam, to Determine the Matching of Ferroelectric Domains
    • Relaxation in Doped Strained Layers of Compound Semiconductors
    • Characterisation of Synthetic Diamond Crystals by Spatially-Resolved Rocking Curve Measurements
    • In situ Real-time Radiography for Process Optimisation ­ Foaming of Metal
    • Micro-SAXS from Polyurethane Foams
    • X-ray Diffraction with Nanometric Spatial Resolution
    • In situ X-ray Microscopic Study of Electromigration
    • X-ray Microfluorescence Imaging of Single Cells

Contents

  • Introduction  
  • Use of Bragg Diffraction Imaging, with a Coherent Beam, to Determine the Matching of Ferroelectric Domains
  • Relaxation in Doped Strained Layers of Compound Semiconductors
  • Characterisation of Synthetic Diamond Crystals by Spatially-Resolved Rocking Curve Measurements
  • In situ Real-time Radiography for Process Optimisation ­ Foaming of Metals
  • Micro-SAXS from Polyurethane Foams
  • X-ray Diffraction with Nanometric Spatial Resolution
  • In situ X-ray Microscopic Study of Electromigration
  • X-ray Microfluorescence Imaging of Single Cells

 

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