EXPLORE ESRF BEAMLINES - ID03 Hard X-ray microscopy beamline - Carsten Detlefs, ESRF scientist in charge of ID03 -

EVERYTHING YOU WANTED TO KNOW ABOUT OUR NEW & UPGRADED BEAMLINES

ID03 Hard X-ray microscopy beamline
Carsten Detlefs, ESRF scientist in charge of ID03

ABSTRACT

The newly built beamline ID03 specializes in hard x-ray microscopy. The main technique offered is dark field x-ray microscopy (DFXM), as pioneered on the prototype instrument on ID06-HXM.

DFXM is a combination of x-ray topography and full field microscopy, where an x-ray objective lens is placed in the Bragg diffracted beam between the sample and  a high resolution detector. The magnified image has an effective resolution of ~150nm and is sensitive to minute variation of the crystal lattice, such as strain fields, dislocations, domains formed by phase transitions, etc. 

The technique can be applied to a wide range of materials, ranging from structural materials such as metals and alloys to functional materials such as ferroelectrics to biominerals.

The beamline is presently undergoing commissioning and will accept general users starting in March, 2024 - the first 10 user proposals have already been selected.

This webinar will provide an overview of the technical capabilities and the target science cases.

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