X-TOP 2014

XTOP brings together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, as well as X-ray phase contrast imaging (radiography and micro- tomography). XTOP is thus one of the central scientific conference concerning methods and instrumentation in synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography.